X-Ray inspection19 videos
XR75 TCO (A.L.L.) Technology Introduction
Introduction of Anritsu's A.L.L. technology which significantly lowers Total Cost of Ownership of X-ray Inspection System.
XR75 Side View Introduction
Introduction of Anritsu XR75 Side View X-ray Inspection System.
XR75 Large Introduction
Introduction of Anritsu XR75 X-ray Inspection System for large products.
XR75 DualX Introduction
Introduction of Anritsu XR75 DualX. Anritsu adopts Dual Energy technologies to achieve the industry-leading detection performance in low-dense contaminants such as poulty bones, etc.
Exceeding your foreign matter HACCP specification can save you money
Learn how greater detection levels can reduce your false reject rates as well as minimize or possibly eliminate your need to rework products.
Complete HACCP food inspection solution in tight production line spaces
Anritsu XR75 y Costo de Pertenencia
Demostracion de avances technologicos en maquinas Rayos X.
X-ray Inspection System For Pharmaceutical products
Suitable for pharmaceutical products that cannot be inspected by conventional means.
Anritsu Infivis DemoVan
Take a look at our Anritsu Infivis DemoVan fully equipped with our XR75 X-Ray, SV Checkweigher, and the M6 Metal Detector. Learn how to set up products to look for contaminants, overfill, underfill and test with your own products.
Anritsu Infivis - Hazard Analysis Critical Control Point System
Shown at the Pack Expo, Anritsu Infivis displayed the latest process in foreign contamination detection - a hazard analysis critical control point system.
XR75 Next Generation X-Ray Inspection Technology
The new XR75 X-Ray Inspection Model is the highest standard in X-Ray Inspection Technology. With a lifetime three times the conventional models, you will be able to reduce lifetime costs by 20% or more. Learn more about the XR75 X-Ray Model.
XR75 Side View X-Ray Inspection System
Highest Performance with Lowest Cost of Ownership. Protect your brand against recalls with the XR75, our most advanced X-Ray Inspection System.
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